We deposited neutral-aluminum atoms in thin parallel lines to form a grating with a line separation of 154.7 nm by using near-resonant laser light and direct-write optical lithography techniques. We did this by using the single-frequency closed UV transition from the second ground state 3p2P3/2 (F = 4) to 3d2D5/2 (F = 5) at 309.4 nm. The aluminum features were analyzed with an atomic-force microscope.
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McGowan et al. (1995) studied this question.
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