A new set-up for collecting high-quality data suitable for structural refinement at high pressure and high temperature has been developed on beamline ID30 at the ESRF. The possibility of using high X-ray energies, high brilliance of third-generation sources and a new fast imaging-plate detector interfaced to the Paris–Edinburgh large-volume press has lead to a significant reduction of acquisition time and improvement of the quality of the data. The feasibility of angle-dispersive X-ray diffraction experiments at high pressure and high temperature, even on light elements, has been demonstrated.
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Mézouar et al. (1999) studied this question.
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