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We describe a computational method, based on scattering-matrix techniques, for calculating the electromagnetic response of multilayer systems that may include both anisotropic dielectric media and periodically inhomogeneous grating structures. The method calculates the transmission and reflection coefficients of the structure, the electromagnetic field profiles in any layer, and the dispersion relations for normal modes of the system. As illustrative examples, the method is applied to a silver gratings and to doped semiconductor heterostructures with overlaid metallic gratings that act as photon-plasmon coupling structures.
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Ager et al. (1991) studied this question.
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