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August 15, 1998Journal of Applied Physics

Real time spectroscopic ellipsometry characterization of structural and thermal equilibration of amorphous silicon–carbon alloy p layers in p-i-n solar cell fabrication

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Authors

HFHiroyuki FujiwaraJKJoohyun KohYLYeeheng Lee

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Fujiwara et al. (1998) studied this question.

synapsesocial.com/papers/6a9af72f783bdf95f967d8a2https://doi.org/10.1063/1.368361
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