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We have conducted transmission electron microscopic observations along the [001] direction of the interfaces between Y2BaCuO5 inclusions and the YBa2Cu3O7 matrix in the YBaCuO crystals fabricated by the Melt-Powder-Melt-Growth process. Amorphous layers about 1 nm in thickness are observed at some interfaces. We could not find observable crystallographic defects at the interfaces.
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Yamaguchi et al. (1990) studied this question.
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