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We investigate the multiple-imaging in two-dimensional (2-D) multimode silicon Hollow waveguides. Two waveguides with dimensions 40×80 μm2and 80×80 μm2are fabricated using microelectromechanical system compatible technology and measured at 675 nm. The multiple-imaging in the 2-D transverse plane is reported, and the measured imaging lengths agree with the theoretical predictions.
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Yehia et al. (2004) studied this question.
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