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December 5, 2011IEEE Electron Device Letters

Microwave Power Performance N-Polar GaN MISHEMTs Grown by MOCVD on SiC Substrates Using an Al₂O₃ Etch-Stop Technology

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Authors

SKSeshadri KolluriAnalog Devices (United States)SKS. KellerUniversity of California, Santa BarbaraSteven P. DenBaarsSteven P. DenBaarsLinköping University

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Kolluri et al. (2011) studied this question.

synapsesocial.com/papers/6a9c7706b916c720a4d4df48https://doi.org/10.1109/led.2011.2173458
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