An automatic x-ray diffractometer for the investigation of liquid structures has been built. The specimen is held in a horizontal position. The x-ray source and detector rotate in a vertical plane about the center of the specimen face, maintaining equal angles of incidence and diffraction and a constant d(sinθ)/dt. Precise adjustment devices are provided for the parameters of the diffraction geometry and for a crystal monochromator which may be located in either the incident or diffracted beam. A variety of specimen holders may be used, including a high temperature stage which is designed to minimize condensation of vapors evaporating from the specimen.
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Kaplow et al. (1963) studied this question.
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