We have used grazing incidence x-ray scattering to study the structure of a smectic-C* liquid crystal (LC) at the buried LC-glass interface in liquid crystal films. This measurement is done in reflection mode through the glass substrate, which consists of a grating photolithographed onto a 220μm thick slide. The x-ray energy has been tuned such that it can penetrate the 220μm slide, such that the layers close to the interface can be studied. We have observed the smectic-C* evolve as a function of depth within the film, and compared it to equivalent films analyzed from the free (air) surface.
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L. J. Martı́nez-Miranda (2004) studied this question.
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