Authors
A new instrumental technique that combines scanning electrochemical microscopy and scanning photoelectrochemical microscopy is described. This technique is capable of monitoring electroassisted and/or photoassisted reactions on semiconductor surfaces either concurrently or sequentially. The instrument uses a probe which consists of an optical fiber coated with gold and isolated from its surrounding environment with a polymer film. Measurements of the electroreduction of at the gold ring which had been generated by photo‐oxidation of Br − on a 50 Å thick film on Ti are discussed.
No takes yet. Share an insight, caveat, or question.
Casillas et al. (1995) studied this question.