Answers are grounded in this paper and cite their sources.
An x-ray standing wave field generated under total external reflection condition is used to characterize the average vertical dimension of metal nanoparticles as well as their nature of dispersion on a flat surface. This approach is applied to characterize the distribution of Fe nanoparticles deposited on a silicon surface using a solution dip method. The atomic force microscopy results on these nanoparticles reinforce our interpretation. The authors believe that the present method has a strong utility in characterizing, over a large area, the morphology of the surfaces coated with nanoparticles. The method also provides element specific analysis for the nanoparticulate matter.
No takes yet. Share an insight, caveat, or question.
Tiwari et al. (2008) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: