We have developed a scanning magnetic microscopy technique for noninvasively imaging submicron magnetic fields from embedded microscopic electrical circuits. We are able to extract from the field data a complete profile of current densities using a mathematical algorithm. As an example, we provide current density images of micron-scale passivated conductors undergoing electromigration.
No takes yet. Share an insight, caveat, or question.
Schrag et al. (2003) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: