The electron swarm growth processes in SF 6 -Xe gas mixtures have been studied by a pulsed Townsend method over the range 32.24⩽ E / N ⩽564.2 Td (1 Td = 10 -21 Vm 2 ), where E is the electric field and N is the gas density of the mixture. The variation patterns as a function of the density-reduced electric field of the effective ionization coefficient , electron drift velocity Ve and longitudinal diffusion coefficient D L in SF 6 -Xe gas mixtures have been given. The dielectric strength of SF 6 -Xe gas mixtures has also been determined, which varies linearly with SF 6 concentration in the gas mixtures.
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Zhu et al. (2000) studied this question.
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