We have performed depth profile studies of the structure of PbZr0.2Ti0.8O3 films of different thicknesses deposited on SrTiO3 substrates prepared by pulsed laser deposition, using grazing incident x-ray scattering (GIXS). The in-plane structure of the films reveals these consist of up to three domains, one c-axis domain, and two a-axis domains, denoted a1 and a2. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films, particularly in the a1 domains. This strain evolution is accompanied by the presence of twist grain boundaries in the plane in some films. The measured in-plane lattice parameters are asymmetric, which suggests an orthorhombic distortion of the lattice in the plane of the films.
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Li et al. (2002) studied this question.
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