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We have investigated extended electric field-vs.-current density E-J characteristics in YBCO coated IBAD tapes. The results of a Monte-Carlo study on the depinning in a random pin medium were compared with measurements. Using a low temperature scanning laser microscope, we examined the percolative behavior of the local resistive transition in the YBCO tape. It was also shown that the depinning probability, which is proportional to the dynamic resistance of the E-J curves, is scaled as a function of reduced current density with the aid of a power index. Consequently, the E-J characteristics in the tapes can be described by the combination of the two kinds of scaling laws: one is the scaling law of the depinning probability predicted in a random network and the other is the scaling law for the flux pinning force. These properties agree well with the percolation model of depinned clusters.
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Kiss et al. (2003) studied this question.
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