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A quantitative design procedure has been developed for a number of ``latching'' and analog ferrite devices which enables accurate prediction of both their loss and phase characteristics given the intrinsic material parameters and dimensions of the device structure. Radio-frequency magnetic properties of remanent state materials are represented by an ``averaged'' complex tensor permeability which takes into account the average effects of domain structure and permits loss and phase to be related to properties such as intrinsic linewidth, anisotropy field, and saturation and remanent magnetization. Phase and loss characteristics for each device are obtained by a computer-aided solution of the pertinent boundary value problem. Excellent agreement is obtained between analytical predictions and measured characteristics.
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Allen et al. (1967) studied this question.
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