An ultrahigh vacuum reflectometer is described. It can be used to study reflectance, transmittance, and photoemission on samples evaporated in situ. The angle of incidence can be varied from 0 to ±90° in steps of 7.5°. The system rotates about the axis of the incident light for study of polarization effects. With the polarized continuum of synchrotron radiation and a normal-incidence monochromator the reflectometer allows measurements with polarized light at wavelengths down to about 300 Å.
No takes yet. Share an insight, caveat, or question.
Feuerbacher et al. (1969) studied this question.
Synapse has enriched 3 closely related papers on similar clinical questions. Consider them for comparative context: