Vanadium dioxide (VO2) has been identified as a material capable of transitioning from an insulator to a metal close to room temperature. Previous works have demonstrated potential applications of this material in various microwave components or devices. However, the complex permittivity and permeability characterization of the VO2over X-band has not been previously reported. Knowledge of these properties is essential for accurate modeling of the components and devices utilizing VO2. This paper characterizes a VO2film deposited on a quartz substrate in a WR90 waveguide using a vector network analyzer. The S-parameters, conductivity, relative complex permittivity, and permeability of the VO2film are determined across the transition temperature.
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Mapleback et al. (2019) studied this question.
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