Li Depth Profiling Near Interfaces in Thin-Film All-Solid-State Batteries by TOF-ERDA

Q: What does this research mean for the field?

Time-of-Flight Elastic Recoil Detection Analysis (TOF-ERDA) enables nanoscale tracking of lithium concentration depth profiles near the positive electrode/solid electrolyte interface during charge and discharge cycles in thin-film all-solid-state batteries. Novelty: ClaimNovelty.METHODOLOGICAL. Consensus alignment: ConsensusAlignment.NEUTRAL.

T. Majima; Keisuke Yasuda; B. Tsuchiya

doi:10.5796/denkikagaku.26-fe0307

September 4, 2026Denki KagakuOpen Access

Li Depth Profiling Near Interfaces in Thin-Film All-Solid-State Batteries by TOF-ERDA

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Key Points

To evaluate the nanoscale depth distribution and dynamic behavior of lithium ions near electrode-solid electrolyte interfaces during charging and discharging cycles in thin-film all-solid-state batteries.
Utilized elastic recoil detection analysis (ERDA) with mega-electronvolt (MeV) ion beams to achieve standard-free absolute quantification of light elements.
Applied high-resolution time-of-flight ERDA (TOF-ERDA) offering nanometer-scale depth resolution to operando or cycled thin-film all-solid-state lithium-ion battery interfaces.
Demonstrated direct, non-destructive tracking of lithium concentration gradients across the cathode-solid electrolyte boundary.
Captured dynamic shifts in lithium depth profiles corresponding to distinct charge and discharge states without requiring sample pre-treatment.

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Implication

Experimental analysis demonstrates nanoscale lithium depth profiling at electrode interfaces during battery cycling, highlighting mechanisms controlling solid-state battery performance.

Abstract

全固体リチウム(Li)イオン電池において，電極-固体電解質界面近傍におけるLi挙動は，電池性能を左右する最も重要な研究対象のひとつである．MeVイオンビームを用いる弾性反跳粒子検出分析(ERDA)は，特段の前処理なしに，水素(H)やLiなどの軽元素を標準試料なしで深さ方向に絶対定量できる数少ない手法である．本記事では，まずERDAの原理とH定量の測定例を示す．その後，深さ分解能をnmオーダーまで高めた飛行時間測定型ERDA (TOF-ERDA)

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Majima et al. (2026) studied this question.

synapsesocial.com/papers/6a9e8531c3034f961570d738 https://doi.org/10.5796/denkikagaku.26-fe0307

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Li Depth Profiling Near Interfaces in Thin-Film All-Solid-State Batteries by TOF-ERDA

Key Points

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Abstract

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Li Depth Profiling Near Interfaces in Thin-Film All-Solid-State Batteries by TOF-ERDA

Key Points

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Implication

Abstract

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Cite This Study

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