Electron Microscopy of Thin Twins and Stacking Faults

It is shown that complex patterns appearing in the electron microscopic images of thin twins are related to overlapping of two boundaries, bending of foils, and existence of lattice defects such as dislocations and successive stacking faults. Overlapping of distant stacking faults sometimes shows contrasts similar to those of thin twins. It is found to be possible to distinguish between them by using properties of those patterns.