We report FT-IR-VCD recorded under improved conditions of signal-to-noise ratio, resolution, and spectral range (to 800 cm −1 ). Detailed descriptions are provided in the areas of artifact suppression, phase correction procedures, and comparison of FT-IR to dispersive VCD measurements. Spectral evidence supports the proposition that VCD absorbance artifacts are a surface effect originating at the optical window-solution interface.
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Lipp et al. (1984) studied this question.
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