Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
November 1, 1995Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Fabrication of thickness-controlled silicon nanowires and their characteristics

View Full Paper
Ask AI
Bookmark
Share

Authors

HNHideo NamatsuNTT (Japan)YTYasuo TakahashiShowa CorporationMNMasao NagaseTokushima University

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Namatsu et al. (1995) studied this question.

synapsesocial.com/papers/6a9ec7bfe2d0fc9581be7769https://doi.org/10.1116/1.588097
View Full Paper
Ask AI
Bookmark
Share