This is the authors' abstract. We don't add key points for this paper.
A femtosecond pump–probe technique, capable of probing transient changes in intense X-ray-excited matter with monochromatic X-ray pulses and accessing data for both positive and negative delay times, is proposed. The application of this technique to single-crystal silicon revealed ultrafast X-ray-induced electron excitation occurring on a timescale of 10 fs, along with the delayed onset of atomic disordering relative to the electronic excitation. This technique will pave the way for atom-specific multidimensional spectroscopy and diagnostics of exotic states of matter created by X-ray irradiation with sophisticated probing techniques, such as single-crystal diffraction, inelastic scattering, X-ray Thomson scattering, and absorption spectroscopy.
Answers are grounded in this paper and cite their sources.
No takes yet. Share an insight, caveat, or question.
Inoue et al. (2025) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: