A technique was developed to estimate the R ‐curve behavior of Y‐TZP using indentation‐produced flaws. This technique allows crack‐growth resistance to be determined for short crack extensions (micrometers). For Y‐TZP samples sintered at 1600°C for 1 h (mean grain size, 0.7 μm), the crackgrowth resistance increases rapidly over the first 10 μm. Peak toughness values determined from this technique correlate with chevron‐notch fracture toughness if the ellipticity of the indentation‐produced flaw is considered.
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Anderson et al. (1990) studied this question.
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