X–ray topographic study of striation formation in layer growth of crystals from solutions

The Lang X–ray topography method and double–crystal plane–wave X–ray topography combined with image treatment have been used to study the zonal inhomogeneity formation during crystal growth from solutions. It is shown that striation formation in crystals can be caused not only by the variations of the external growth conditions, but also by the action of some ‘interna’ factors such as the variations in the dislocation structure of the crystal and modification of the growth–step distribution on the growing faces. The homogeneity of rapidly grown KDP crystals (10 to 16 mm d–1) was quantitatively evaluated with accuracy of ca. 10–7 Å.