Antiferroelectric-phase PLZT for use in high density optical data storage

An experiment was performed to establish the possible use of PLZT as an optical data and information storage device by demonstrating its high resolution capabilities. The maximum resolvable resolution obtained in a sample of 7.6/70/30 PLZT with a 4 μm average grain diameter was 140 line pair per millimeter. This translates to a storage density of 5 × 107 bits/in2. The limiting factor of the resolution was found to be the grain diameter. This result suggests that thin film PLZT with average grain diamters of 0.1μm or less are theoretically capable of storing 5000 lp/mm or 6 × 1010 bits/in2.