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Thermally stimulated exoelectron emission (TSEE) and thermally stimulated luminescence (TSL) preliminary excited by X-rays of Al2O3 single crystals containing different amounts of Mg impurities and treated under oxiding and reducing conditions are investigated. TSEE and TSL are found to be due to the recombination process of holes thermally released from traps on Mg2+ ions (TSEE and TSL peaks at 230 K) as well as of electrons thermally released from traps (TSEE and TSL peaks at 255 K). TSEE is observed synchronously with the F-centre emission in the 3.0 eV band both, in the hole and electron recombination process. The experimental results are interpreted basing on the model of hole-electron recombination in the two-centre Auger-process.
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Кортов et al. (1985) studied this question.
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