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In this work, we propose an 8-channel arrayed waveguide grating (AWG) designed for synchronized de-multiplexing of both polarization and wavelength. The AWG device is fabricated on a 220 nm-thick top-silicon Silicon-On-Insulator (SOI) wafer using a straightforward single-etch process. It demonstrates the ability for wavelength division de-multiplexing across both TE and TM polarization states, ranging from 1530 to 1542 nm. Measurements reveal that the insertion loss for each channel is less than 3 dB. Additionally, the polarization-dependent loss measures at 1 dB. These experimental results underline the superior performance characteristics of the designed polarization-insensitive AWG. To the best of our knowledge, this is the first reported C-band silicon AWG that accomplishes polarization-wavelength synchronous demultiplexing. This development introduces a new perspective in the design and functionality of AWGs, highlighting the significant potential of this device in the realm of optical communication.
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Bai et al. (2023) studied this question.
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