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An energy analysing electron microscope has been used to investigate the measurement of plasmon energy losses in the vicinity of crystal dislocations. It is shown that the presence of dislocations causes a perturbation in the plasmon energy loss in regions close to the dislocation. A shift of ±0.1 eV is measured in a region ±20 nm surrounding the dislocation.
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D. Spalding (1976) studied this question.
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