CoFe-coated carbon nanotube (CNT) probes have been successfully fabricated by a radio-frequency sputtering method. The sputtering conditions for obtaining a uniform ferromagnetic film on the CNT probe were investigated. The optimal sputtering conditions were determined from the observations using a scanning electron microscope and an atomic force microscope. CNT magnetic force microscope (MFM) probes prepared under optimized conditions provided us clear images with an ultimate lateral resolution of approximately 10 nm.
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Kuramochi et al. (2005) studied this question.
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