In situ evaporated polycrystalline Yb films at different substrate temperatures ($10<T<~300$ K) were studied by surface-sensitive photoemission (hν=40.8 eV). The presence of substrcture in the surface-derived 4f¹³ components allowed an identification of multiple surface shifts as being due to different coordination numbers of surface atoms. The temperature-dependent intensity variation of the surface emission could be correlated with the temperature-dependent change of the surface microstructure.
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Schneider et al. (1983) studied this question.