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Synchrotron X-ray diffraction at grazing incidence has led to the identification of a new crystal structure of quaterthiophene (4T, see Figure). Epitaxial growth of the oligothiophene, deposited by organic molecular beam deposition (OMBD), on a potassium acid phthalate (KAP) crystal substrate is demonstrated on the basis of the commensurability of the 4T crystal (ac diagonal) with the b-axis of the KAP crystal.
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Timpanaro et al. (2001) studied this question.
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