Sharp silicon tips, coated with diamond, were tested concerning electron gun application. Emission stability, reproducibility of current–voltage characteristics, and beam confinement in the vacuum of 10−6 Torr were studied. No hysteresis or shift of emission characteristics during long term testing have been found. Low frequency current fluctuations were less than 10%. The electron source was tested over a 120 h period and the current decrease was within 10% of the initial value at the end of the test period. The divergence half-angle of emitted electrons was found to be within 3°.
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Givargizov et al. (1997) studied this question.