A Leakage-Compensated PLL in 65-nm CMOS Technology

A leakage compensation technique is presented to compensate the on-chip loop filter leakage for phase-locked loops in 65-nm complementary metal-oxide-semiconductor technology. Using the leakage compensation technique, the measured root-mean-square jitter is reduced to 3.10 ps when the output frequency is 950 MHz. This chip consumes 10 mW, and the active area is 0.14 mm2.