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April 1, 1998Journal of Microscopy

Reliability of atom column positions in a ternary system determined by quantitative high‐resolution transmission electron microscopy

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OKO. KienzleFEF. ErnstGMG. Möbus

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Kienzle et al. (1998) studied this question.

synapsesocial.com/papers/6aa2a474375ea2a2e2fdd2e3https://doi.org/10.1046/j.1365-2818.1998.3090862.x
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  1. 1The atomistic structure of a Σ = 3, (111) grain boundary in NiAl, studied by quantitative high-resolution transmission electron microscopy1996 · 29 citations