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January 31, 2014IEEE Electron Device Letters

Origin of the SET Kinetics of the Resistive Switching in Tantalum Oxide Thin Films

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Authors

YNYoshifumi NishiSMStephan MenzelKFK. Fleck

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Nishi et al. (2014) studied this question.

synapsesocial.com/papers/6aa3552969def0a53fc60c4dhttps://doi.org/10.1109/led.2013.2294868
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