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Parallel and perpendicular resonance conditions are derived for films under stress σ applied either uniaxially along [110] or [112] directions, or isotropically in the film plane. The shift of the resonance field is expressed in a dimensionless form up to the fourth power of the magnetostriction constants λ100 and λ111 multiplied by σ, the influence of the cubic magnetocrystalline anisotropy is included. Only in the perpendicular configuration with isotropic σ the shift is a linear function of σ. A method for measuring λ100 on (111)-thin films is proposed.
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L. Půst (1983) studied this question.
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