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Thin films of gold-silver alloy on n-type silicon were prepared by vacuum deposition of the alloy. The characteristics of the contacts were investigated by means of V-I and C-V measurements. The results showed that the barrier height of Au–Ag alloy–Si contacts varies linearly, from 0.67±0.02 eV to 0.80±0.02 eV, with composition of the alloy film. This is interpreted in terms of the change in work function which is linearly dependent upon the composition.
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Arizumi et al. (1968) studied this question.
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