The analysis of particle size distributions from field-ion microscope data

This paper describes a method of obtaining second phase particle size distributions from field-ion data. The method relies on the image persistences of particles during field evaporation sequences. In order to reduce the amount of manipulation on the micrographs a statistical approach, which is independent of particle positions in the specimen, is adopted. This approach has distinct advantages over more direct methods and extensions of it could be applied to the analysis of data from other types of microscopy.