Operating principles and hardness assurance methods are discussed for various types of optocouplers. Radiation damage in light-emitting diodes is addressed, along with the impact of phototransistors and internal amplifiers on overall performance. Hardness assurance for optocouplers is contrasted with the approach used for conventional microelectronics. Methods of detecting abnormal devices are discussed, along with the implementation of special screening measurements.
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Johnston et al. (2009) studied this question.
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