Polystyrene is a promising organic insulator for use in organic electronic devices owing to its excellent electrical and mechanical characteristics. However, much of the work that has been done in characterising polystyrene has been done on films several micrometres thick, and as such is difficult to relate to the properties that need to be considered for electronic devices, where films thicknesses are generally in the nanometre range. In this report, we focus on the electrical characteristics of nanometre thin films, both in terms of current-voltage behavior, and capacitance-voltage characteristics and how the properties of the polystyrene films are altered by differing annealing temperatures.
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Prime et al. (2008) studied this question.
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