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February 27, 2009Journal of Microscopy

Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low‐kV BSE imaging

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Authors

DWD. A. Matthijs de WinterUniversity of Applied Sciences UtrechtCSChris T.W.M. SchneijdenbergUniversity of Applied Sciences UtrechtMLMisjaël N. LebbinkUtrecht University

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Winter et al. (2009) studied this question.

synapsesocial.com/papers/6aa54da1bc2c7db7488e38b2https://doi.org/10.1111/j.1365-2818.2009.03139.x
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