Effect on the Asymmetric Bragg-Case Diffraction of X-Rays on the Yield of X-Ray Photoelectrons from a Silicon Single Crystal

Angular variations in the yield of silicon K -photoelectrons are observed in process of two asymmetric Bragg-case diffractions of X-rays with the asymmetry factors of | b | and | b | -1 . The double-crystal arrangement of parallel setting is used for the 220 diffraction of silicon with Cu K α radiation. Anomalies found in the yield of photoelectrons show a remarkable difference between two cases. The observed curves agree fairly well with the calculated ones based on the dynamical diffraction theory.