We report a near-field microwave scanning probe which allows local phase-sensitive polarimetric measurements with a subwavelength spatial resolution (at least λ/16). The probe is a symmetrical transmitting/receiving antenna formed by two very narrow orthogonal slits fabricated at the end plate of a circular waveguide. A linearly polarized incident wave passes through one slit and is reflected from the sample mounted in the near field of the probe. A reflected wave with the incident polarization is received by the same slit, while the orthogonal polarization component is received by another, orthogonal slit. Our probe is very sensitive to local inhomogeneities and may be also useful for mapping Hall mobilities in semiconductors.
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Lann et al. (1999) studied this question.
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