Nonionizing energy loss (NIEL) calculations are reported for the neutron, electron, and gamma irradiation in InGaAs. We discuss the correlation between the calculated NIEL values and the experimentally observed offset voltage shift in InP-InGaAs heterojunction bipolar transistors.
No takes yet. Share an insight, caveat, or question.
Shatalov et al. (2001) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: