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The authors propose and demonstrate a vertical flash memory device incorporating protein-mediated ordering of nanocrystal floating gate to help circumvent density scaling and/or performance limitations of planar flash memory with continuous floating gate. The scalability of the vertical architecture can allow the theoretical maximum array density of 1∕4F2 (F: minimum lithographic pitch), thus circumventing the integration density limitations of planar flash transistor arrays. The nanocrystal floating gate renders reasonable retention, while the protein-mediated ordering of nanocrystals allows scalability and manufacturability. With tunneling program/erase, a memory window of 0.5V, endurance >105cycles, and retention beyond 105s is reported.
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Sarkar et al. (2007) studied this question.
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