Oxygen diffusion in YSZ single crystals at relatively low temperatures

The 18O tracer experiments were carried out on two cubic YSZ single crystals at temperatures of TD = 423 K and TD = 473 K. The diffusion profiles were determined by the SIMS technique. The diffusion coefficients, the surface exchange coefficients and the activation enthalpy are discussed together with earlier data at higher temperatures. The present oxygen diffusion data demonstrate that the same diffusion process is operating over a wide temperature range. (© 2003 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)