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We measured high-frequency spin-transfer resonances from <8GHz to >26GHz excited by dc currents through giant magnetoresistance point contacts with diameters d from <50 to almost 300nm. The slope of resonance frequency versus current decreased with increased d and was fit best by a spin-transfer model where the effective d extends ⩾50nm past the contact edge into the surrounding magnetic film. An increased resonance critical current versus contact area was also fit well by this model including a surrounding ring of excited area. Spin-transfer resonance in large devices eliminates the need for electron-beam lithography in applications.
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Mancoff et al. (2006) studied this question.
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