Spectroscopic ellipsometry and atomic force microscope techniques were employed to analyze optical properties, microstructure and thickness of cobalt oxide thin films deposited on metal substrates by the sol-gel dipping method.The ellipsometric data were conveniently fitted, assuming a stratified structure for the deposited film, which consists of a sublayer native oxide that was coated with a bi-layered Co 3 O 4 film.The dispersion curves (refractive indices and extinction coefficients) were reported in the 1.5-4.5 eV photon energy range.Excluding the Fe substrate, in which nucleation failed to grow Co 3 O 4 , all deposited films have the Co 3 O 4 cobalt oxide phase as the predominant one.Additional data concerning solar parameters such as absorptance, emittance and selectivity of Co 3 O 4 /metal structures were also reported.
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C. Barrera (2013) studied this question.