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TEM study of PZT thin films prepared by sol-gel techniques on Si - SiO2 - Ti—Pt substrates is presented. The films are subjected to a heat treatment at 650°C. Structural changes are studied in relation to lead excess in initial solution varied through a wide range from 5 to 50 mol. %. Main trends in microstructure transformation connected with the lead content are reported.
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Сигов et al. (2012) studied this question.
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